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Eunkyoung Shim

Eunkyoung Shim

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North Carolina State University · Textiles

Active 2003–2026

h-index17
Citations976
Papers6925 last 5y
Funding
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About

Eunkyoung Shim is an Associate Professor in the Department of Textiles at NC State University, affiliated with the Wilson College of Textiles. Her research focuses on nonwovens and textile engineering, with particular emphasis on the development and analysis of fiber and filter media structures. Her work includes investigating the effects of polymer rheology on meltblowing fiber formation, designing nonwoven filters for environmental applications such as stormwater runoff treatment, and developing high-performance nonwovens for healthcare packaging. Her research projects involve advanced imaging techniques like micro-CT to analyze the 3D structures of filter media and evaluate their filtration behaviors. She has contributed to developing nonwoven-based hybrid filters aimed at reducing nutrient and microbial loading in stormwater, addressing environmental concerns such as eutrophication caused by algal blooms. Additionally, her work encompasses the development of stretchable electronics, fiber dispersion evaluation in aqueous media, and the study of charging technologies for aerosol filtration. Her contributions advance the understanding of fiber and nonwoven material properties, aiming to improve filtration efficiency, environmental sustainability, and innovative textile applications.

Research topics

  • Materials science
  • Composite material
  • Computer Science
  • Physics
  • Radiology
  • Engineering
  • Optoelectronics
  • Medicine
  • Geology
  • Optics
  • Nanotechnology

Selected publications

  • Supplementary Information

    Open MIND · 2026-03-02

    other

    Supplementary Information for In-situ imaging of domain walls in ferroelectric single crystals by instant polarized light microscopy, including additional control experimens and results.

  • Supplementary Video 2(associated to Figure 15)

    Open MIND · 2026-03-02

    other

    Video for the combined hue and value processed images for the EDP process, matching with figure 15

  • <i>In situ</i> imaging of domain walls in ferroelectric single crystals by instant polarized light microscopy

    Review of Scientific Instruments · 2026-03-01

    article

    Ferroelectric domain walls separate regions of uniform polarization in ferroelectric materials, and their controlled manipulation, such as through electric poling, is essential for enhancing the electromechanical performance of advanced ferroelectric devices. While most existing imaging techniques only examine static domain structures at the pre- or post-poling state, real-time, in situ, and non-destructive visualization of internal domain wall dynamics during electric poling using a simple implementation remains a significant challenge. In this work, we present a simple and accessible optical technique, instant polarized light microscopy (IPOLπ), for through-volume, single-shot, and in situ observation of domain wall evolution during electric poling. Demonstrated on [110]-oriented Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystals, IPOLπ enables direct observation of polarization dynamics during alternating current poling and electrical depoling. The method reveals the formation of layered domain structures initiating at sample edges and progressing inward, as well as the correlation between optical birefringence changes and electrical current response. This low-cost, robust technique provides a powerful tool for studying real-time domain wall behavior, offering new insights into structure-property relationships in functional ferroelectric crystals.

  • Supplementary Video 2(associated to Figure 15)

    AIP Publishing · 2026-03-02

    otherOpen access

    Video for the combined hue and value processed images for the EDP process, matching with figure 15

  • Supplementary Video 1 (associated toFigure 13)

    AIP Publishing · 2026-03-02

    otherOpen access

    Video for the combined hue and value processed images for the ACP process, matching with figure 13

  • <strong>In-situ imaging of domain walls in ferroelectric single crystals by instant polarized light microscopy</strong>

    Open MIND · 2026-03-02

    other1st authorCorresponding

    Ferroelectric domain walls separate regions of uniform polarization in ferroelectric materials, and their controlled manipulation-such as through electric poling-is essential for enhancing the electromechanical performance of advanced ferroelectric devices. While most existing imaging techniques only examine static domain structures at the pre- or post-poling state, real-time, in-situ, and non-destructive visualization of internal domain wall dynamics during electric poling using a simple implementation remains a significant challenge. In this work, we present a simple and accessible optical technique, <strong>instant polarized light microscopy (IPOL</strong>π<strong>)</strong>, for through-volume, single-shot, and in-situ observation of domain wall evolution during electric poling. Demonstrated on [110]-oriented Pb(In₁/₂Nb₁/₂)O₃-Pb(Mg₁/₃Nb₂/₃)O₃-PbTiO₃ single crystals, IPOLπ enables direct observation of polarization dynamics during alternating current poling (ACP) and electrical depoling (EDP). The method reveals the formation of layered domain structures initiating at sample edges and progressing inward, as well as the correlation between optical birefringence changes and electrical current response. This low-cost, robust technique provides a powerful tool for studying real-time domain wall behavior, offering new insights into structure-property relationships in functional ferroelectric crystals.

  • Supplementary Video 1 (associated toFigure 13)

    Open MIND · 2026-03-02

    other

    Video for the combined hue and value processed images for the ACP process, matching with figure 13

  • <strong>In-situ imaging of domain walls in ferroelectric single crystals by instant polarized light microscopy</strong>

    AIP Publishing · 2026-03-02

    otherOpen access1st authorCorresponding

    Ferroelectric domain walls separate regions of uniform polarization in ferroelectric materials, and their controlled manipulation-such as through electric poling-is essential for enhancing the electromechanical performance of advanced ferroelectric devices. While most existing imaging techniques only examine static domain structures at the pre- or post-poling state, real-time, in-situ, and non-destructive visualization of internal domain wall dynamics during electric poling using a simple implementation remains a significant challenge. In this work, we present a simple and accessible optical technique, <strong>instant polarized light microscopy (IPOL</strong>π<strong>)</strong>, for through-volume, single-shot, and in-situ observation of domain wall evolution during electric poling. Demonstrated on [110]-oriented Pb(In₁/₂Nb₁/₂)O₃-Pb(Mg₁/₃Nb₂/₃)O₃-PbTiO₃ single crystals, IPOLπ enables direct observation of polarization dynamics during alternating current poling (ACP) and electrical depoling (EDP). The method reveals the formation of layered domain structures initiating at sample edges and progressing inward, as well as the correlation between optical birefringence changes and electrical current response. This low-cost, robust technique provides a powerful tool for studying real-time domain wall behavior, offering new insights into structure-property relationships in functional ferroelectric crystals.

  • Supplementary Information

    AIP Publishing · 2026-03-02

    otherOpen access

    Supplementary Information for In-situ imaging of domain walls in ferroelectric single crystals by instant polarized light microscopy, including additional control experimens and results.

  • SDDC-YOLO: A Diagnostic Framework for Defect Detection in Industrial Materials

    2026-01-26

    article

    SUMMARY & CONCLUSIONSSurface defect detection in industrial materials remains a critical challenge due to the presence of small, irregular anomalies and complex texture backgrounds. This study proposes Small Defect-aware with Densely Connected pyramid YOLO (SDDC-YOLO), a YOLOv8-based defect detection framework designed to improve small surface anomaly recognition in industrial materials. By integrating a Densely Connected Feature Pyramid (DCFP) into the YOLOv8 architecture and extending the detection head to five output scales, the model effectively enhances multi-scale feature fusion and subtle details preservation. Experimental results on an industrial material defect dataset show that the proposed SDDC-YOLO outperforms segmentation models (e.g., U-Net, DeepLabV3+) and YOLO-based detection models, demonstrating its potential practicality and robustness for automated industrial inspection.

Frequent coauthors

  • Behnam Pourdeyhimi

    40 shared
  • Yu Song

    Donghua University

    9 shared
  • Ali Kılıç

    Istanbul Technical University

    9 shared
  • Wei Gao

    7 shared
  • Nanfei He

    5 shared
  • Wei Wei

    Shanghai Jiao Tong University

    5 shared
  • Lanjun Yin

    4 shared
  • Rohit Kumar

    Indian Institute of Technology Roorkee

    4 shared

Labs

Education

  • Ph. D., Fiber and Polymer Science

    North Carolina State University

    2001
  • M. S. , Clothing and Textiles

    Seoul National University

    1996
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